Simulations are slow and cannot capture hardware-specific effects or complex hardware–software interactions
Beam time is scarce and expensive. When you finally get access, there is no second chance.
Radiation-test results are difficult to reuse. Every design iteration means returning to the facility.
Dynamic Fault injection in the configuration memory, Flip-Flops, BRAMs and LUTRAM via JTAG. No hardware modification. No design adjustments.
Define custom fault-injection campaigns. Adjust the injection rate. Choose any region of the Device Under Test. Cover all edge cases.
Record real radiation effects during beam time and replay them in your lab. In any DUT, as many times as needed, at no extra cost.
Evaluate the reliability of your design, in your own lab, on your own schedule. No queues, reduced costs. Iterate as fast as your design does.
European Space Agency Business Incubation Centre Greece
Backed by strong academic foundations
Radiation characterisation - Dependability assessments
End-to-end radiation testing for FPGA applications. From facility access to final report.
System-level reliability analysis including FTA, FMECA and FDIR strategy design for safety-critical embedded applications.
FPGA hardware acceleration and embedded software development for safety-critical systems